- Summary
- Classical Mosfet
- Transistor that operates by using an Electrical field to invert the channel allowing conduction from source to drain
- The Classical Mosfet Dimensions
- Include length the short distance in this picture, Width is the longer dimension
- Functionality
- Length reduction results in loss of control over the channel
- performance reduction
- Finfet
- Goal
- solve performance reduction caused by smaller sizes
- Wrap the gate electrode around the channel
- Thin fin of sillicon acts as the channel and it is encased by the gate electrode
- Silicon fin surrounded by extension implant and poly oxide
- Premise
- di-electric and metal gate allows for a stronger e-field to be formed as it increases the dimensions of the gate effective using the height/thickness of the fin as the channel length allowing for a decrease in overall size when compared to a typical Mosfet
- Source and Drain can be wrapped in silicon germanium or silicon carbon stressors just like classical transistors
- Shown below is a representation of a finfet design used for production
- The gate electrode is uniform for ease of construction
- Clarification of terminology
- After seeing the design used for production, we can see that it is nearly identical to the construction of the tri-gate
- The only difference is that a tri-gate includes multiple sources and drains whereas the finfet description shows only a single source and drain but the process of construction seems identical, and terminology could be used interchangeably assuming you're fine with annoying Intel
- The original papers indicate that the original process of the finfet did not wrap around on top of the fin, lowering the overall z or height of the overall transistor but this is too complicated of a process for mass production so the standard finfet is equivalent to the tri-gate which does wrap around
- Benefits
- Maintain performance which includes
- Conductivity when turned on
- Insulation when turned off
- Finfet in relation to a standard mosfet reduces electron tunneling effect when insulation is small
- Main issues are - weaker dielectric, small size
- Finfet significantly increases volume of dielectric reducing leakage currents
- increase switching speed
- due to lower size due to gate capacitance being smaller
- note - non-issue in modern constructions, interface delay between metals is more significant as we get to smaller scale
- Lower's Voltage requirements
- increases lifetime/efficiency of product per charge
- Company Promises
- estimation, 2-5% higher price in exchange for 37% speed increase and 90% reduction in leakage current
- Complications
- Adds complexity to construction process
- possible reduction in yield
- can increase price significantly above 2-5% estimate for the company overall
- Depending on process
- high k-dielectrics are more expensive, but already required as transistor size decreases
- Increased modeling difficulty
- geomotries now are first order effects
- random fluctuations in manufacturing can now cause deviations in result
- impacts possible econcomic forecasts for the division
- Verification
- requires new software to ensure design rules for fin to fin spacing is followed
- History
- construction process has roots in 1990s
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